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Effects of charge compensation on colossal permittivity and electrical properties of grain boundary of cacu3ti4o12 ceramics substituted by al3+ and ta5+ /nb5+
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Metadata
Document Title
Effects of charge compensation on colossal permittivity and electrical properties of grain boundary of cacu3ti4o12 ceramics substituted by al3+ and ta5+ /nb5+
Author
Boonlakhorn J., Manyam J., Srepusharawoot P., Krongsuk S., Thongbai P.
Name from Authors Collection
Affiliations
Giant Dielectric and Computational Design Research Group (GD–CDR), Department of Physics, Faculty of Science, Khon Kaen University, Khon Kaen, 40002, Thailand; Institute of Nanomaterials Research and Innovation for Energy (IN–RIE), NANOTEC–KKU RNN on Nanomaterials Research and Innovation for Energy, Khon Kaen University, Khon Kaen, 40002, Thailand; National Nanotechnology Center (NANOTEC), National Science and Technology Development Agency (NSTDA), Pathum Thani, 12120, Thailand
Type
Article
Source Title
Molecules
ISSN
14203049
Year
2021
Volume
26
Issue
11
Open Access
All Open Access, Gold, Green
Publisher
MDPI AG
DOI
10.3390/molecules26113294
Format
Abstract
The effects of charge compensation on dielectric and electrical properties of CaCu3Ti4 x(Al1/2Ta1/4Nb1/4)xO12 ceramics (x = 0−0.05) prepared by a solid-state reaction method were studied based on the configuration of defect dipoles. A single phase of CaCu3Ti4O12 was observed in all ceramics with a slight change in lattice parameters. The mean grain size of CaCu3Ti4 x(Al1/2Ta1/4Nb1/4)xO12 ceramics was slightly smaller than that of the undoped ceramic. The dielectric loss tangent can be reduced by a factor of 13 (tanδ ~0.017), while the dielectric permittivity was higher than 104 over a wide frequency range. Impedance spectroscopy showed that the significant decrease in tanδ was attributed to the highly increased resistance of the grain boundary by two orders of magnitude. The DFT calculation showed that the preferential sites of Al and Nb/Ta were closed together in the Ti sites, forming self-charge compensation, and resulting in the enhanced potential barrier height at the grain boundary. Therefore, the improved dielectric properties of CaCu3Ti4-x(Al1/2Ta1/4Nb1/4)xO12 ceramics associated with the enhanced electrical properties of grain boundaries. In addition, the non-Ohmic properties were also improved. Characterization of the grain boundaries under a DC bias showed the reduction of potential barrier height at the grain boundary. The overall results indicated that the origin of the colossal dielectric properties was caused by the internal barrier layer capacitor structure, in which the Schottky barriers at the grain boundaries were formed. © 2021 by the authors. Licensee MDPI, Basel, Switzerland.
Industrial Classification
Knowledge Taxonomy Level 1
Knowledge Taxonomy Level 2
Knowledge Taxonomy Level 3
Funding Sponsor
Khon Kaen University; National Science and Technology Development Agency; National Nanotechnology Center; Ministry of Higher Education, Science, Research and Innovation, Thailand
License
N/A
Rights
N/A
Publication Source
Scopus